| Model WATS-2010M |
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Automatic
measurement on dynamic hysteresis loop of soft magnetic
(silicon steel) material under 50Hz, 60Hz, 400Hz and
1kHz, accurate measurement on dynamic magnetic
characteristic parameters such as amplitude permeability
μa, loss angle δ, total losses Ps, remanence Br and
coercive force Hc.
Windows
measurement software applied simply. The
product conforms to China National Standards GB / T3655
- 92, GB / T13789 - 92 and international standard
IEC60404 - 6.
Analog source (bridge),
frequency meter, ammeter, voltmeter and wattmeter are
replaced through computer control and A/D sampling,
entire testing process automatically
completed.
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System Specifications
Under 50Hz frequency, use 25cm epstein trames to measure
silicon steel sample, technical indices as follows:
| Parameters measured |
Bm (%) |
Hm(%) |
μa(%) |
Ps(%) |
δ(%) |
| Uncertainty (k=2) |
1 |
1 |
2 |
1 |
2 |
| Repeatability (constant temperature) |
± 0.5 |
± 0.5 |
± 1 |
± 0.5 |
± 1 |
Instrument Specifications
| WATS - 2010M Dynamic
Hysteresisgraph |
|
PC6111 A/D Card |
Output Power: 500VA sine
wave
Frequency Range: 45Hz~
1000Hz
Frequency
Fineness: 1Hz
Frequency
Error: < 0.05%
Output Voltage:
0 ~ 10V ~ 50V ~ 150V ~ 300V, four automatic
ranges
Voltage Fineness: Program
Control 1mV, panel < 0.1% * current
range
Voltage Distortion
Factor: Superior to
0.5%
Voltage Stability:
Superior to 0.02%
Sampling
Current: 2mA, 5mA, 10mA, 20mA, 40mA, 80mA, 200mA,
400mA,
800mA,
1.6A, 4A, 8A (Peak
Value)
Sample Voltage: 20mV,
40mV, 100mV, 200mV, 400mV, 800mV, 2V, 4V, 8V,
16V,
40V,
80V, 160V, 320V, 800V, 1600V (Peak Value) |
Conversion time: <= 2.5
μ s (every channel)
Resolution and
Linearity: 12 Bit ± 1 /2 LSB
Voltage Range: ± 5 V ~ ± 10 V
Sampling Clock: 5 μ s ~ 10ms Hardware
Clock
Internal Storage Capacity:
4k Byte
Structure: PCI
busbar | |
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